Schroen, W. H. (1977). NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977: NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977. : test structures and diagnostic techniques; physical MOS models; process modeling; modeling of I2L and process selection (1. izd.). NATO.
Chicago stil citiranjaSchroen, W. H. NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977: NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977. : test structures and diagnostic techniques; physical MOS models; process modeling; modeling of I2L and process selection. 1. izd. NATO, 1977.
MLA stil citiranjaSchroen, W. H. NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977: NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977. : test structures and diagnostic techniques; physical MOS models; process modeling; modeling of I2L and process selection. 1. izd. NATO, 1977.