Introduction to ID̳D̳Q̳ testing - Chakravarty, Sreejit; Thadikaran, Paul J. (Boston : Kluwer Academic Publishers, 1997)
On t.p. "D̳D̳Q̳" is subscript.
Includes bibliographical references (p. 287-315) and index.
Keywords: Iddq testing; Digital integrated circuits -- Testing; Integrated circuits -- Very large scale integration -- Testing