Reliability physics. - International Reliability Physics Symposium; IEEE Electron Devices Society; IEEE Reliability Group; IEEE Reliability Society; Institute of Electrical and Electronics Engineers. Electron Devices Group (New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, 1993)
Description based on: 19th (Apr. 7-9, 1981).
Chemical abstracts
Also issued online.
Sponsored by: the IEEE Electron Devices Society and the IEEE Reliability Group, 1970- ; the IEEE Electron Devices Group and the IEEE Reliability Group, <1974-1978>; the IEEE Electron Devices Society and the IEEE Reliability Society, <1981>-1993.
SERBIB/SERLOC merged record
Keywords: Electronic apparatus and appliances -- Reliability -- Congresses; Electronic apparatus and appliances -- Testing -- Congresses; Integrated circuits -- Reliability -- Congresses; Integrated circuits -- Testing -- Congresses