Žilak, J., & Suligaj, T. (2017). Charateristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology: Charateristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology : doctoral thesis. Zagreb: J. Žilak ; Fakultet elektrotehnike i računarstva.
Chicago stil citiranjaŽilak, Josip, and Tomislav Suligaj. Charateristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology: Charateristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology : doctoral thesis. Zagreb: J. Žilak ; Fakultet elektrotehnike i računarstva, 2017.
MLA stil citiranjaŽilak, Josip, and Tomislav Suligaj. Charateristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology: Charateristics of radio frequency integrated circuits and device reliability in horizontal current bipolar transistor technology : doctoral thesis. Zagreb: J. Žilak ; Fakultet elektrotehnike i računarstva, 2017.