On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungstein thin films - Djerdj, Igor; Tonejc, Anđelka; Tonejc, Antun; Radić, Nikola, fizičar (2006)
Bibliografija: 21 jed
Sažetak
Keywords: Tanki filmovi -- Volfram -- Mikrostruktura; Kristali -- Strukturna analiza