VLSI testing
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:25775/Details |
|---|---|
| Ostali autori: | Williams, T. W. (Editor) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
North-Holland Publishing Company,
1986.
|
| Izdanje: | 1. izd |
| Nakladnička cjelina: |
Advances in CAD for VLSI / North-Holland Publishing Company ;
VOL. 5 |
| LEADER | 00568nam a2200193uu 4500 | ||
|---|---|---|---|
| 008 | s1986 a |||||||||| ||eng|d | ||
| 020 | |a 0444878955 | ||
| 035 | |a HR-ZaFER 30131 | ||
| 040 | |a HR-ZaFER |b hrv |c HR-ZaFER | ||
| 041 | |a eng | ||
| 245 | |a VLSI testing. | ||
| 250 | |a 1. izd. | ||
| 260 | |b North-Holland Publishing Company, |c 1986. | ||
| 300 | |a ix, 275 str. : |b graf. prikazi ; |c 25 cm. | ||
| 490 | |a Advances in CAD for VLSI / North-Holland Publishing Company ; |v VOL. 5 | ||
| 700 | |9 27889 |a Williams, T. W. |4 edt | ||
| 942 | |b BKS |c K | ||
| 990 | |a 28153 | ||
| 999 | |c 25775 |d 25775 | ||