Semiconductor reliability
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:29311/Details |
|---|---|
| Glavni autori: | Shwop, E.John (-), Sullivan, Harold J. (Author) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Engineering Publishers,
1961.
|
| Izdanje: | 1. izd |
| LEADER | 00474nam a2200181uu 4500 | ||
|---|---|---|---|
| 008 | s1961 |||||||||| ||eng|d | ||
| 035 | |a HR-ZaFER 33703 | ||
| 040 | |a HR-ZaFER |b hrv |c HR-ZaFER | ||
| 041 | |a eng | ||
| 100 | 1 | |9 30695 |a Shwop, E.John | |
| 245 | |a Semiconductor reliability. | ||
| 250 | |a 1. izd. | ||
| 260 | |b Engineering Publishers, |c 1961. | ||
| 300 | |a 309 str. |c cm. | ||
| 700 | |9 30696 |a Sullivan, Harold J. |4 aut | ||
| 942 | |b BKS |c K | ||
| 990 | |a 31512 | ||
| 999 | |c 29311 |d 29311 | ||