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01394cam a22003254a 4500 |
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20130713153405.0 |
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010202s2001 maua b 001 0 eng |
| 010 |
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|a 2001023211
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|a 0792373146 (hardcover : alk. paper)
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|a DLC
|c DLC
|d HR-ZaFER
|b hrv
|e ppiak
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|a pcc
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|a TK7870.23
|b .S64 2001
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|a 621.381
|2 21
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| 100 |
1 |
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|a Sousa, José T. de.
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| 245 |
1 |
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|a Boundary-scan interconnect diagnosis /
|c José T. de Sousa, Peter Y.K. Cheung.
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| 260 |
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|a Boston :
|b Kluwer Academic Publishers,
|c c2001.
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| 300 |
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|a xxi, 168 p. :
|b ill. ;
|c 25 cm.
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| 440 |
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|a Frontiers in electronic testing ;
|v 18
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| 504 |
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|a Includes bibliographical references (p. 145-150) and index.
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| 650 |
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|a Boundary scan testing.
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| 650 |
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0 |
|a Electronic apparatus and appliances
|x Testing.
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| 650 |
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0 |
|a Electronic packaging.
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| 650 |
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|a Electric contacts
|x Testing.
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| 700 |
1 |
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|a Cheung, Peter Y. K.
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| 856 |
4 |
2 |
|3 Publisher description
|u http://www.loc.gov/catdir/enhancements/fy0821/2001023211-d.html
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| 856 |
4 |
1 |
|3 Table of contents only
|u http://www.loc.gov/catdir/enhancements/fy0821/2001023211-t.html
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|a 7
|b cbc
|c orignew
|d 1
|e ocip
|f 20
|g y-gencatlg
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|2 udc
|c K
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|a to ASCD pc05 02-02-01; jg11 02-05-01; jg12 02-06-01; jg07 02-06-01; to Dewey 02-06-01; aa07 02-06-01; bk rec'd, to CIP ver. ps16 05-16-01; jg00 06-01-01;
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| 999 |
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|c 34570
|d 34570
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