From contamination to defects, faults, and yield loss
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:34706 |
|---|---|
| Glavni autor: | Khare, Jitendra B. (-) |
| Ostali autori: | Maly, W. (-) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Boston :
Kluwer Academic Publishers,
c1996.
|
| Nakladnička cjelina: |
Frontiers in electronic testing
|
| Predmet: | |
| Online pristup: |
Publisher description Table of contents only |