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| LEADER |
01094pam a2200289 a 4500 |
| 005 |
20130713153549.0 |
| 008 |
971008s1998 nyua b 101 0 eng |
| 010 |
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|a 97044564
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| 020 |
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|a 0780342682
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| 040 |
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|a DLC
|c DLC
|d HR-ZaFER
|b hrv
|e ppiak
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| 050 |
0 |
0 |
|a TK7878.4
|b .I528 1998
|
| 082 |
0 |
0 |
|a 620/.0044
|2 21
|
| 245 |
0 |
0 |
|a Instrumentation and measurement technology and applications /
|c Emil M. Petriu, editor.
|
| 260 |
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|a New York :
|b Institute of Electrical and Electronics Engineers,
|c c1998.
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| 300 |
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|a XX, 521 str. :
|b ilustr. ;
|c 29 cm.
|
| 440 |
|
0 |
|a IEEE technology update series
|
| 500 |
|
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|a A collection of selected papers from recent IEEE conferences.
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| 504 |
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|a Includes bibliographical references and index.
|
| 650 |
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0 |
|a Electronic instruments.
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| 650 |
|
0 |
|a Measurement.
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| 650 |
|
0 |
|a Optoelectronics.
|
| 650 |
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0 |
|a Detectors.
|
| 700 |
1 |
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|a Petriu, Emil.
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| 906 |
|
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|a 7
|b cbc
|c orignew
|d 1
|e ocip
|f 19
|g y-gencatlg
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| 942 |
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|2 udc
|c K
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| 955 |
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|a pc17 to ja00 10-08-97; jf05 to subj. 10/08/97; jf08 10-08-97 to SL;jf12 10-09-97; CIP ver. pv04 10-19-98
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| 999 |
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|c 37024
|d 37024
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