Semiconductor material and device characterization
| Permalink: | http://skupni.nsk.hr/Record/irb.0003158/Similar |
|---|---|
| Glavni autor: | Schroder, Dieter K. (Author) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
New York [etc.] :
John Wiley,
1998.
|
| Izdanje: | 2nd ed |
| Nakladnička cjelina: |
A Wiley-Interscience Publication
|
| Predmet: |
APA stil citiranja
Schroder, D. K. (1998). Semiconductor material and device characterization: Semiconductor material and device characterization (2nd ed.). New York [etc.]: John Wiley.
Chicago stil citiranjaSchroder, Dieter K. Semiconductor material and device characterization: Semiconductor material and device characterization. 2nd ed. New York [etc.]: John Wiley, 1998.
MLA stil citiranjaSchroder, Dieter K. Semiconductor material and device characterization: Semiconductor material and device characterization. 2nd ed. New York [etc.]: John Wiley, 1998.