Transmission electron microscopy of semiconductor nanostructures

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Glavni autor: Rosenauer, Andreas (Author)
Vrsta građe: Knjiga
Jezik: eng
Impresum: Berlin [etc.] : Springer, cop. 2003.
Nakladnička cjelina: Springer tracts in modern physics, ISSN 0081-3869 ; 182
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040 |a HR-ZaIRB  |b hrv  |c HR-ZaIRB  |e ppiak 
080 |a 621.315.5:537.533.35 
100 1 |4 aut  |a Rosenauer, Andreas 
245 1 0 |a Transmission electron microscopy of semiconductor nanostructures :  |b an analysis of composition and strain state /  |c andreas Rosenauer. 
260 |a Berlin [etc.] :   |b Springer,   |c cop. 2003. 
300 |a XII, 238 str. :   |b ilustr. ;   |c 24 cm. 
490 1 |a Springer tracts in modern physics, ISSN 0081-3869 ;   |v 182 
504 |a Bibliografija. 
653 |a compound semiconductors  |a electron microscopy  |a nanostructures 
830 0 |a Springer tracts in modern physics, ISSN 0081-3869 ;   |v 182 
942 |c BOOK 
998 |c Konjević, Sofija 
999 |c 3939  |d 3939