Infrared ellipsometry on semiconductor layer structures
| Permalink: | http://skupni.nsk.hr/Record/irb.0004718 |
|---|---|
| Glavni autor: | Schubert, Matias (Author) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Berlin [etc.] :
Springer,
cop. 2004.
|
| Nakladnička cjelina: |
Springer tracts in modern physics, ISSN 0081-3869 ;
209 |
| Predmet: |