Microscopic identification of electronic defects in semiconductors
| Permalink: | http://skupni.nsk.hr/Record/irb.0013443 |
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| Ostali autori: | Johnson, Noble M. (Editor), Bishop, Stephen G., Watkins, George |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Pittsburgh, Pennsylvania :
Materials Research Society,
cop. 1985.
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| Nakladnička cjelina: |
Materials Research Society symposia proceedings ;
vol. 46 |
| Predmet: |