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|a 621.315.592
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| 111 |
1 |
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|a International Conference
|c Betlehem, Pennsylvania.
|d 1991.
|n 16.
|
| 245 |
1 |
0 |
|a Defects in semiconductors 16, part 3:
|b proceedings of the 16th International Conference /
|c edited by Gordon Davies, Gary G. DeLeo and Michael Stavola.
|
| 260 |
|
|
|a Zuerich :
|b Trans tech,
|c 1992 .
|
| 300 |
|
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|a 1081-1604 str. :
|b ilustr. ;
|c 25 cm.
|
| 490 |
1 |
|
|a Materials science forum ;
|v vol.83-87
|x 0255-5476
|
| 830 |
|
0 |
|a Materials science forum
|
| 504 |
|
|
|a Kazalo.
|
| 653 |
|
|
|a defects in SiC and diamond
|a hetero-epitaxy and strained layers
|a superlattices
|a processing-induced defects
|a effects of defects on devices
|
| 700 |
1 |
|
|4 edt
|a Davies, Gordon
|
| 700 |
1 |
|
|4 edt
|a DeLeo, Gary G.
|
| 700 |
1 |
|
|4 edt
|a Stavola, Michael
|
| 942 |
|
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|c BOOK
|
| 998 |
|
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|c Mihalić, Mirjana
|
| 999 |
|
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|c 26713
|d 26713
|
