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00905nam a2200289 i 4500 |
| 001 |
NSK01000852938 |
| 003 |
HR-ZaNSK |
| 005 |
20210325093045.0 |
| 007 |
ta |
| 008 |
130903s2012 xxud 001 0 eng |
| 020 |
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|a 9781613243268
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| 035 |
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|a (HR-ZaNSK)000852938
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| 040 |
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|a HR-ZaNSK
|b hrv
|c HR-ZaNSK
|e ppiak
|
| 080 |
1 |
|
|a 621.384
|2 2011
|
| 080 |
1 |
|
|a 535-34
|2 2011
|
| 080 |
1 |
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|a 620.17
|2 2011
|
| 245 |
0 |
0 |
|a X-ray scattering /
|c Christopher M. Bauwens.
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| 260 |
|
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|a New York :
|b Nova Science,
|c cop. 2012.
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| 300 |
|
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|a X, 247 str. :
|b graf. prikazi ;
|c 26 cm.
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| 490 |
0 |
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|a Materials science and technologies
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| 504 |
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|a Bibliografija uz svaki rad.
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| 504 |
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|a Kazalo.
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| 650 |
|
7 |
|a Industrijska radiografija
|2 nskps
|
| 650 |
|
7 |
|a Rendgenske zrake
|x Raspršenje
|2 nskps
|
| 700 |
1 |
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|a Bauwens, Christopher M.
|4 edt
|
| 760 |
1 |
8 |
|t Materials science and technologies
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| 998 |
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|m vhok1309
|m vhor1310
|c mzoo131108
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