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Preporučene teme: Testing
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3
IEEE Electron Devices Society
3
IEEE Reliability Society
3
Institute of Electrical and Electronics Engineers
3
International Reliability Physics Symposium
2
IEEE Reliability Group
2
Institute of Electrical and Electronics Engineers. Electron Devices Group
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1
Association for Computing Machinery
1
Beck, Kent
1
Binder, Robert, 1950-
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Blitz, Jack
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Boehm, Ann E., 1938-
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Brassard, Marla R.
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Bâzu, M. I. (Marius I.), 1948-
1
Băjenescu, Titu I., 1938-
1
Chakravarty, Sreejit
1
Cheung, Peter Y. K.
1
Csopaki, Gyula
1
Derickson, Dennis
1
Dibuz, Sarolta
1
Dufort, Benoit, 1970-
1
Gackstatter, Erwin
1
Gao, Jerry
1
Gill, Paul, 1942-
1
Gizopoulos, Dimitris
1
Hecker, Siegfried S.
1
Hsia, Pei
1
IEEE Power Engineering Society. Power System Instrumentation and Measurements Committee
1
IEEE Symposium on Computer Software Reliability
1
IFIP TC6 International Workshop on Testing of Communicating Systems
1
Iman, Sasan
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