Crystallographic phase and orientation analysis of GaAs nanowires by ESEM, EDS, TEM, HRTEM and SAED

Autor: Tonejc, Anđelka, Gradečak, Silvija, Tonejc, Antun Bijelić, Mirjana, Posilović, Hrvoje Bermanec, Vladimir, Tambe, Michael
Matična publikacija: Proceedings of 14th European Microscopy Congress EMC 2008, Volumen 2, Materials Science (2008)