Slični primjerci

• NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977. : device modeling; modeling of bipolar devices
  Autor:: Engl, W. L., et al.
  Impresum: (1977)
• NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977. : measurements for bipolar devices
  Autor:: Jaspers, P. G. A.
  Impresum: (1977)
• NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977. : pattern generation for integrated circuit fabrication; fundamental limits in integrated circuits
  Autor:: Widmann, D.
  Impresum: (1977)
• Process and device modeling for integrated circuit design : [proceedings of the NATO Advanced Study Institute on Process and device modeling for integrated circuit design, Louvain-la-Neuve, Belgium, July 19-29, 1977]
  Impresum: (1977)
• NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977. : semiconductor physics and characterization of bipolar transistors; bipolar transistor model for IC design; process oriented IC design
  Autor:: Scharfetter, D. L.
  Impresum: (1977)