NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977.
Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:25152/Details |
---|---|
Glavni autor: | Merckel, G. (-) |
Vrsta građe: | Knjiga |
Jezik: | eng |
Impresum: |
NATO,
1977.
|
Izdanje: | 1. izd |
LEADER | 00805nam a2200181uu 4500 | ||
---|---|---|---|
005 | 20161104102106.0 | ||
008 | s1977 a |||||||||| ||eng|d | ||
035 | |a HR-ZaFER 29502 | ||
040 | |a HR-ZaFER |b hrv |c HR-ZaFER |e ppiak | ||
041 | |a eng | ||
100 | 1 | |9 27475 |a Merckel, G. | |
245 | |a NATO advanced study institute on process and device modeling for integrated circuit design : Univesrite Catholique Louvain, july 19-29, 1977. : |b surface characterization C-V technique; surface characterization - weak inversion; ion implanted MOS transistors - depletion mode devices; short channels - scaled down MOSFER's; sos MOSFET's; CAD models of MOSFET's / | ||
250 | |a 1. izd. | ||
260 | |b NATO, |c 1977. | ||
300 | |a razl.pag str. : |b ilustr. ; |c 30 cm. | ||
942 | |c K |2 udc | ||
990 | |a 27558 | ||
999 | |c 25152 |d 25152 |