LSI/VLSI testability design
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:25731/Details |
|---|---|
| Glavni autor: | Tsui, Frank F. (-) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
McGraw-Hill Book Company, Inc,
1988.
|
| Izdanje: | 1. izd |
| LEADER | 00489nam a2200181uu 4500 | ||
|---|---|---|---|
| 008 | s1988 xxua |||||||||| ||eng|d | ||
| 020 | |a 0071003568 | ||
| 035 | |a HR-ZaFER 30087 | ||
| 040 | |a HR-ZaFER |b hrv |c HR-ZaFER | ||
| 041 | |a eng | ||
| 100 | 1 | |9 27858 |a Tsui, Frank F. | |
| 245 | |a LSI/VLSI testability design. | ||
| 250 | |a 1. izd. | ||
| 260 | |b McGraw-Hill Book Company, Inc., |c 1988. | ||
| 300 | |a xv, 702 str. : |b graf. prikazi ; |c 22 cm. | ||
| 942 | |b BKS |c K | ||
| 990 | |a 28110 | ||
| 999 | |c 25731 |d 25731 | ||