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01384cam a2200313 a 4500 |
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20130713153411.0 |
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970421s1997 maua b 001 0 eng |
| 010 |
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|a 97016861
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| 020 |
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|a 0792399455 (acidfree paper)
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| 040 |
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|a DLC
|c DLC
|d HR-ZaFER
|b hrv
|e ppiak
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| 050 |
0 |
0 |
|a TK7871.99.M44
|b C4 1997
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| 082 |
0 |
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|a 621.39/5/0287
|2 21
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| 100 |
1 |
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|a Chakravarty, Sreejit.
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| 245 |
1 |
0 |
|a Introduction to ID̳D̳Q̳ testing /
|c by Sreejit Chakravarty and Paul J. Thadikaran.
|
| 260 |
|
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|a Boston :
|b Kluwer Academic Publishers,
|c c1997.
|
| 300 |
|
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|a xvii, 322 p. :
|b ill. ;
|c 25 cm.
|
| 440 |
|
0 |
|a Frontiers in electronic testing
|
| 500 |
|
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|a On t.p. "D̳D̳Q̳" is subscript.
|
| 504 |
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|a Includes bibliographical references (p. 287-315) and index.
|
| 650 |
|
0 |
|a Iddq testing.
|
| 650 |
|
0 |
|a Digital integrated circuits
|x Testing.
|
| 650 |
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0 |
|a Integrated circuits
|x Very large scale integration
|x Testing.
|
| 700 |
1 |
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|a Thadikaran, Paul J.
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| 856 |
4 |
2 |
|3 Publisher description
|u http://www.loc.gov/catdir/enhancements/fy0821/97016861-d.html
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| 856 |
4 |
1 |
|3 Table of contents only
|u http://www.loc.gov/catdir/enhancements/fy0821/97016861-t.html
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|a 7
|b cbc
|c orignew
|d 1
|e ocip
|f 19
|g y-gencatlg
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| 942 |
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|2 udc
|c K
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| 955 |
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|a pc03 to ja00 04-21-97; jf06 to subj 04-22-97; jf08 04-22-97 to SL; je05 to DDC 04-22-97; bk. recd. jd00 07-08-97; CIP ver. jd99 07-16-97
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| 999 |
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|c 34684
|d 34684
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