28th annual proceedings reliability physics
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:36133 |
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| Ostali autor: | International Reliability Physics Symposium (-), IEEE Electron Devices Society, IEEE Reliability Group, IEEE Reliability Society, Institute of Electrical and Electronics Engineers. Electron Devices Group |
| Vrsta građe: | Serijska građa |
| Jezik: | eng |
| Impresum: |
New Orleans
Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers,
-c1990.
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| Predmet: |