Posjedovanje: Reliability physics

Permalink:	http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:36176
Ostali autor:	International Reliability Physics Symposium (-), IEEE Electron Devices Society, IEEE Reliability Group, IEEE Reliability Society, Institute of Electrical and Electronics Engineers. Electron Devices Group
Vrsta građe:	Serijska građa
Jezik:	eng
Impresum:	New York, N.Y. : Electron Devices and Reliability Societies of the Institute of Electrical and Electronics Engineers, -c1993.
Predmet:	Electronic apparatus and appliances > Reliability > Congresses. Electronic apparatus and appliances > Testing > Congresses. Integrated circuits > Reliability > Congresses. Integrated circuits > Testing > Congresses.

Signatura:	5426
Primjerak 5426	Dostupno