Testability concepts for digital ICS
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:7287/Details |
|---|---|
| Glavni autori: | Beenker, F. P. M. (-), Bennetts, R. G. (Author), Thijssen, A. P. |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Dordrecht :
Kluwer Academic Publishers,
1995.
|
| Izdanje: | 1. izd |
| Nakladnička cjelina: |
Frontiers in Electronic Testing / Kluwer Academic Publishers ;
VOLUME 3 |
| LEADER | 00744nam a2200229uu 4500 | ||
|---|---|---|---|
| 008 | s1995 ne a |||||||||| ||eng|d | ||
| 020 | |a 0792396588 | ||
| 035 | |a HR-ZaFER 8781 | ||
| 040 | |a HR-ZaFER |b hrv |c HR-ZaFER | ||
| 041 | |a eng | ||
| 080 | |a 681.3.06 |j SOFTVER |9 1783 | ||
| 100 | 1 | |9 12773 |a Beenker, F. P. M. | |
| 245 | |a Testability concepts for digital ICS : |b THE MACRO TEST APPROACH. | ||
| 250 | |a 1. izd. | ||
| 260 | |a Dordrecht : |b Kluwer Academic Publishers, |c 1995. | ||
| 300 | |a ix, 212 str. : |b ilustr. ; |c 25 cm. | ||
| 490 | |a Frontiers in Electronic Testing / Kluwer Academic Publishers ; |v VOLUME 3 | ||
| 700 | |9 12774 |a Bennetts, R. G. |4 aut | ||
| 700 | |9 12775 |a Thijssen, A. P. |4 aut | ||
| 942 | |b BKS |c K | ||
| 990 | |a 8670 | ||
| 999 | |c 7287 |d 7287 | ||