Assessing fault model and test quality
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:7390 |
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| Glavni autori: | Butler, Kenneth M. (-), Mercer, M. Ray (Author) |
| Ostali autori: | Allen, Jonathan (Editor) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Dordrecht :
Kluwer Academic Publishers,
1992.
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| Izdanje: | 1. izd |
| Nakladnička cjelina: |
The Kluwer International Series in Engineering and Computing. VLSI, Computer Architecture and Digital Signal Pr / Kluwer Academic Publishers.
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