Assessing fault model and test quality
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:7390/Details |
|---|---|
| Glavni autori: | Butler, Kenneth M. (-), Mercer, M. Ray (Author) |
| Ostali autori: | Allen, Jonathan (Editor) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
Dordrecht :
Kluwer Academic Publishers,
1992.
|
| Izdanje: | 1. izd |
| Nakladnička cjelina: |
The Kluwer International Series in Engineering and Computing. VLSI, Computer Architecture and Digital Signal Pr / Kluwer Academic Publishers.
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| 008 | s1992 ne a |||||||||| ||eng|d | ||
| 020 | |a 0792392221 | ||
| 035 | |a HR-ZaFER 8884 | ||
| 040 | |a HR-ZaFER |b hrv |c HR-ZaFER | ||
| 041 | |a eng | ||
| 080 | |a 681.3 |h PRECIZNI MEHANIZMI I INSTRUMENTI |j OPREMA ZA OBRADU PODATAKA |e 681 |9 1740 | ||
| 100 | 1 | |9 12865 |a Butler, Kenneth M. | |
| 245 | |a Assessing fault model and test quality. | ||
| 250 | |a 1. izd. | ||
| 260 | |a Dordrecht : |b Kluwer Academic Publishers, |c 1992. | ||
| 300 | |a xviii, 132 str. : |b ilustr. ; |c 25 cm. | ||
| 490 | |a The Kluwer International Series in Engineering and Computing. VLSI, Computer Architecture and Digital Signal Pr / Kluwer Academic Publishers. | ||
| 700 | |9 12866 |a Mercer, M. Ray |4 aut | ||
| 700 | |9 12867 |a Allen, Jonathan |4 edt | ||
| 942 | |b BKS |c K | ||
| 990 | |a 8774 | ||
| 999 | |c 7390 |d 7390 | ||