TEM and XRD structure examination of Sn-doped indium oxide (ITO)
Tin-doped indium oxide (ITO) is an advanced material with many electronic and optical applications due to its high electrical conductivity and transparency to light [1]. These properties are associated both with structure and microstructure [2]. Indium oxide crystallizes in a cubic bixbyite-type str...
| Permalink: | http://skupni.nsk.hr/Record/ffzg.KOHA-OAI-FFZG:315445/Similar |
|---|---|
| Matična publikacija: |
Winter School Abstract Book Ljubljana : Institut Jožef Stefan, 2008 |
| Glavni autori: | Popović, Jasminka (-), Gržeta, Biserka (Author), Tkalčec, Emilija Tonejc, Anđelka, Bijelić, Mirjana Goebbert, Christian |
| Vrsta građe: | Članak |
| Jezik: | eng |
APA stil citiranja
Popović, J. (2008). TEM and XRD structure examination of Sn-doped indium oxide (ITO): TEM and XRD structure examination of Sn-doped indium oxide (ITO). Winter School Abstract Book.
Chicago stil citiranjaPopović, Jasminka. "TEM and XRD structure examination of Sn-doped indium oxide (ITO): TEM and XRD structure examination of Sn-doped indium oxide (ITO)." 2008.
MLA stil citiranjaPopović, Jasminka. "TEM and XRD structure examination of Sn-doped indium oxide (ITO): TEM and XRD structure examination of Sn-doped indium oxide (ITO)." 2008.