Depth profiling by means of total electron yield measurements
| Permalink: | http://skupni.nsk.hr/Record/nsk.NSK01000172871/Details |
|---|---|
| Matična publikacija: |
Fizika A (Zagreb) 4 (1995), 2 ; str. 287-294 |
| Glavni autor: | Ebel, Horst (-) |
| Ostali autori: | Svagera, Robert (-), Kaitna, Roland |
| Vrsta građe: | Članak |
| Jezik: | eng |
| Predmet: |
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| 245 | 1 | 0 | |a Depth profiling by means of total electron yield measurements / |c Horst Ebel, Robert Svagera and Roland Kaitna. |
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| 504 | |a Bibliografija: 5 jed | ||
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| 700 | 1 | |a Kaitna, Roland | |
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