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161220s2014 ci | |0|| ||eng |
| 035 |
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|a (HR-ZaNSK)000951804
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|a HR-ZaNSK
|b hrv
|c HR-ZaNSK
|e ppiak
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|a croatica
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| 044 |
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|a ci
|c hr
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| 080 |
1 |
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|a 621.3
|2 MRF 2011.
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| 100 |
1 |
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|a Wan, Bo
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| 245 |
1 |
0 |
|a Storage degradation mechanism analysis and storage life prediction of the optoelectronic couplers based on multi-channel degradation testing data /
|c B. [Bo] Wan, G. [Guicui] Fu, C. [Chun] Pei, Y. [Yibing] Dong.
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| 300 |
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|b Ilustr.
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| 504 |
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|a Bibliografija: 17 jed.
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| 653 |
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0 |
|a Pouzdanost
|a Vijek trajanja
|a Optoelektronički sprežnik
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| 700 |
1 |
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|a Fu, Guicui
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| 700 |
1 |
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|a Pei, Chun
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| 700 |
1 |
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|a Dong, Yibing
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| 773 |
0 |
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|t Engineering review (Technical Faculty University of Rijeka)
|x 1330-9587
|g 34 (2014), 3 ; str. 209-216
|w nsk.(HR-ZaNSK)000166773
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| 981 |
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|b B10/14
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| 998 |
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|a lblo1612
|a rped1702
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| 856 |
4 |
2 |
|u http://hrcak.srce.hr/index.php?show=clanak&id_clanak_jezik=187396
|y Elektronička verzija članka
|