Testing semiconductor memories
| Permalink: | http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:27447/Details |
|---|---|
| Glavni autor: | Van de Goor, A. J. (-) |
| Vrsta građe: | Knjiga |
| Jezik: | eng |
| Impresum: |
London :
John Wiley & Sons, Inc,
1991.
|
| Izdanje: | 1. izd |
| LEADER | 00518nam a2200181uu 4500 | ||
|---|---|---|---|
| 008 | s1991 xxua |||||||||| ||eng|d | ||
| 020 | |a 0471925861 | ||
| 035 | |a HR-ZaFER 31815 | ||
| 040 | |a HR-ZaFER |b hrv |c HR-ZaFER | ||
| 041 | |a eng | ||
| 100 | 1 | |9 29090 |a Van de Goor, A. J. | |
| 245 | |a Testing semiconductor memories : |b theory and practice. | ||
| 250 | |a 1. izd. | ||
| 260 | |a London : |b John Wiley & Sons, Inc., |c 1991. | ||
| 300 | |a xxiii, 512 str. : |b tabele ; |c 25 cm. | ||
| 942 | |b BKS |c K | ||
| 990 | |a 29741 | ||
| 999 | |c 27447 |d 27447 | ||