Testing semiconductor memories

Permalink: http://skupni.nsk.hr/Record/fer.KOHA-OAI-FER:27447/Similar
Glavni autor: Van de Goor, A. J. (-)
Vrsta građe: Knjiga
Jezik: eng
Impresum: London : John Wiley & Sons, Inc, 1991.
Izdanje: 1. izd

APA stil citiranja

Van de Goor, A. J. (1991). Testing semiconductor memories: Testing semiconductor memories : theory and practice (1. izd.). London: John Wiley & Sons, Inc.

Chicago stil citiranja

Van de Goor, A. J. Testing semiconductor memories: Testing semiconductor memories : theory and practice. 1. izd. London: John Wiley & Sons, Inc, 1991.

MLA stil citiranja

Van de Goor, A. J. Testing semiconductor memories: Testing semiconductor memories : theory and practice. 1. izd. London: John Wiley & Sons, Inc, 1991.