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01811cas a2200385 i 4500 |
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20130713153515.0 |
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940729d19941995njuar 1 a0eng c |
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|b Institute of Electrical and Electronic Engineers, Inc., 455 Hoes La., P.O. Box 1331, Piscataway, NJ 08855-1331
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| 040 |
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|a GAT
|c GAT
|d MCM
|d DLC
|d NSDP
|d OCoLC
|d MCM
|d OCoLC
|d MCM
|d OCoLC
|b hrv
|e ppiak
|
| 042 |
|
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|a pcc
|a nsdp
|
| 050 |
0 |
0 |
|a TK7870
|b .S95
|
| 082 |
0 |
0 |
|a 621.381
|2 19
|
| 210 |
0 |
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|a IEEE int. reliab. phys. proc.
|
| 222 |
|
0 |
|a 33rd annual IEEE international reliability physics proceedings
|
| 245 |
0 |
0 |
|a IEEE international reliability physics proceedings /
|c sponsored by the IEEE Electron Devices Society and the IEEE Reliability Society.
|
| 246 |
3 |
0 |
|a International reliability physics proceedings
|
| 260 |
|
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|a Piscataway, N.J. :
|b The Societies,
|c 1995.
|
| 300 |
|
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|a 405 str. :
|b ill. ;
|c 28 cm.
|
| 310 |
|
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|a Annual
|
| 530 |
|
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|a Also issued online.
|
| 590 |
|
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|a SERBIB/SERLOC merged record
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Reliability
|v Congresses.
|
| 650 |
|
0 |
|a Electronic apparatus and appliances
|x Testing
|v Congresses.
|
| 650 |
|
0 |
|a Integrated circuits
|x Reliability
|v Congresses.
|
| 650 |
|
0 |
|a Integrated circuits
|x Testing
|v Congresses.
|
| 710 |
2 |
|
|a IEEE Electron Devices Society.
|
| 710 |
2 |
|
|a IEEE Reliability Society.
|
| 711 |
2 |
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|a International Reliability Physics Symposium.
|
| 780 |
0 |
0 |
|a International Reliability Physics Symposium.
|t Reliability physics
|x 0735-0791
|w fer.(DLC) 82640313
|w fer.(OCoLC)3766693
|
| 785 |
0 |
0 |
|a International Reliability Physics Symposium.
|t IEEE International Reliability Physics Symposium proceedings
|w fer.(DLC)sn 97038118
|w fer.(OCoLC)36940048
|
| 850 |
|
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|a DLC
|
| 906 |
|
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|a 7
|b cbc
|c serials
|d 2
|e ncip
|f 19
|g n-oclcserc
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| 942 |
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|2 udc
|c K
|
| 999 |
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|c 36134
|d 36134
|