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080205s2006 ci ||| ||eng |
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|9 (HR-ZaNSK)657033
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|a (HR-ZaNSK)000654989
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|a HR-ZaNSK
|b hrv
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|e ppiak
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|a eng
|b hrv
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|a croatica
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|a 538.975
|2 MRF 1998.
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| 080 |
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|a 539.26
|2 MRF 1998.
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| 100 |
1 |
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|a Djerdj, Igor
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| 245 |
1 |
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|a On the applicability of different methods of XRD line profiles analysis in estimating grain size and microstrain in tungstein thin films /
|c Igor Djerdj, Anđelka Tonejc, Antun Tonejc and Nikola Radić.
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| 300 |
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|b Ilustr.
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| 504 |
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|a Bibliografija: 21 jed
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| 504 |
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|a Sažetak
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| 650 |
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7 |
|a Tanki filmovi
|x Volfram
|x Mikrostruktura
|2 nskps
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| 650 |
|
7 |
|a Kristali
|x Strukturna analiza
|2 nskps
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| 700 |
1 |
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|a Tonejc, Anđelka
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| 700 |
1 |
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|a Tonejc, Antun
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| 700 |
1 |
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|a Radić, Nikola,
|c fizičar
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| 773 |
0 |
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|t Fizika A (Zagreb)
|x 1330-0008
|g 15 (2006), 1/4 ; str. 35-50
|w nsk.(HR-ZaNSK)000012252
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| 981 |
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|b B10/06
|p CRO
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| 998 |
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|a rado0802
|a lukp080410
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| 856 |
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|u http://damp.nsk.hr/arhiva/vol3/90/24062/fizika.phy.hr/fizika_a/av06/a15p035.pdf
|y Digitalna verzija članka
|